Novel Sources of Stripe Rust Resistance Identified by Genome-Wide Association Mapping in Ethiopian Durum Wheat (<i>Triticum turgidum</i> ssp. <i>durum</i>).

Liu, Weizhen; Maccaferri, Marco; Rynearson, Sheri; Letta, Tesfaye; Zegeye, Habtemariam; Tuberosa, Roberto; Chen, Xianming; Pumphrey, Michael

Novel Sources of Stripe Rust Resistance Identified by Genome-Wide Association Mapping in Ethiopian Durum Wheat (Triticum turgidum ssp. durum).

Liu, Weizhen; Maccaferri, Marco; Rynearson, Sheri; Letta, Tesfaye; Zegeye, Habtemariam; Tuberosa, Roberto; Chen, Xianming; Pumphrey, Michael.

Afiliação

Liu W; Department of Crop and Soil Sciences, Washington State University, PullmanWA, USA.
Maccaferri M; Department of Agricultural Sciences, University of BolognaBologna, Italy.
Rynearson S; Department of Crop and Soil Sciences, Washington State University, PullmanWA, USA.
Letta T; Sinana Agricultural Research CenterBale-Robe, Ethiopia.
Zegeye H; Ethiopian Institute of Agricultural ResearchAddis Ababa, Ethiopia.
Tuberosa R; Department of Agricultural Sciences, University of BolognaBologna, Italy.
Chen X; Wheat Health, Genetics, and Quality Research Unit, Agricultural Research Service (USDA), PullmanWA, USA.
Pumphrey M; Department of Plant Pathology, Washington State University, PullmanWA, USA.

Front Plant Sci ; 8: 774, 2017.

Article em En | MEDLINE | ID: mdl-28553306

Palavras-chave

90 K wheat SNP array; Ethiopian tetraploid wheat; association analysis; wheat landraces; yellow rust resistance

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies / Risk_factors_studies Idioma: En Revista: Front Plant Sci Ano de publicação: 2017 Tipo de documento: Article País de afiliação: Estados Unidos

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