Defect formation in multiwalled carbon nanotubes under low-energy He and Ne ion irradiation.

Eswara, Santhana; Audinot, Jean-Nicolas; El Adib, Brahime; Guennou, Maël; Wirtz, Tom; Philipp, Patrick

Eswara, Santhana; Audinot, Jean-Nicolas; El Adib, Brahime; Guennou, Maël; Wirtz, Tom; Philipp, Patrick.

Afiliação

Eswara S; Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg.
Audinot JN; Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg.
El Adib B; Materials Research and Technology Department, Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg.
Guennou M; Materials Research and Technology Department, Luxembourg Institute of Science and Technology, 41 rue du Brill, L-4422 Belvaux, Luxembourg.
Wirtz T; Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg.
Philipp P; Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST), 41 rue du Brill, L-4422 Belvaux, Luxembourg.

Beilstein J Nanotechnol ; 9: 1951-1963, 2018.

Article em En | MEDLINE | ID: mdl-30116687

Palavras-chave

Raman; carbon nanotubes; helium ion microscope; ion irradiation; simulations

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Beilstein J Nanotechnol Ano de publicação: 2018 Tipo de documento: Article País de afiliação: Luxemburgo

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