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Using transmission Kikuchi diffraction in a scanning electron microscope to quantify geometrically necessary dislocation density at the nanoscale.
Liang, X Z; Dodge, M F; Jiang, J; Dong, H B.
Afiliação
  • Liang XZ; Department of Engineering, University of Leicester, University Road, Leicester LE1 7RH, UK; Department of Engineering, Engineering Building, Lancaster University, LA1 4YW, UK. Electronic address: x.liang5@lancaster.ac.uk.
  • Dodge MF; TWI Ltd., Great Abington, Cambridge CB21 6AL, UK. Electronic address: michael.Dodge@twi.co.uk.
  • Jiang J; Department of Mechanical Engineering, Imperial College London, South Kensington, London SW7 2AZ, UK. Electronic address: jun.jiang@imperial.ac.uk.
  • Dong HB; Department of Engineering, University of Leicester, University Road, Leicester LE1 7RH, UK. Electronic address: h.dong@le.ac.uk.
Ultramicroscopy ; 197: 39-45, 2019 02.
Article em En | MEDLINE | ID: mdl-30496887
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Ultramicroscopy Ano de publicação: 2019 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Ultramicroscopy Ano de publicação: 2019 Tipo de documento: Article