Simultaneous Identification of Low and High Atomic Number Atoms in Monolayer 2D Materials Using 4D Scanning Transmission Electron Microscopy.

Wen, Yi; Ophus, Colin; Allen, Christopher S; Fang, Shiang; Chen, Jun; Kaxiras, Efthimios; Kirkland, Angus I; Warner, Jamie H

Wen, Yi; Ophus, Colin; Allen, Christopher S; Fang, Shiang; Chen, Jun; Kaxiras, Efthimios; Kirkland, Angus I; Warner, Jamie H.

Afiliação

Wen Y; Department of Materials , University of Oxford , Parks Road , Oxford OX1 3PH , United Kingdom.
Ophus C; National Center for Electron Microscopy, Molecular Foundry , Lawrence Berkeley National Laboratory , 1 Cyclotron Road , Berkeley , California 94720 , United States.
Allen CS; Department of Materials , University of Oxford , Parks Road , Oxford OX1 3PH , United Kingdom.
Fang S; Electron Physical Sciences Imaging Center , Diamond Light Source Ltd. , Didcot , Oxfordshire OX11 0DE , United Kingdom.
Kaxiras E; Department of Materials , University of Oxford , Parks Road , Oxford OX1 3PH , United Kingdom.
Warner JH; Department of Materials , University of Oxford , Parks Road , Oxford OX1 3PH , United Kingdom.

Nano Lett ; 19(9): 6482-6491, 2019 Sep 11.

Article em En | MEDLINE | ID: mdl-31430158

Palavras-chave

4D STEM; MoS; adatom; amorphous carbon; low angle annular dark field; ptychographic phase reconstruction

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Revista: Nano Lett Ano de publicação: 2019 Tipo de documento: Article País de afiliação: Reino Unido

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