Characterisation of the PS-PMMA Interfaces in Microphase Separated Block Copolymer Thin Films by Analytical (S)TEM.

Bürger, Julius; Kunnathully, Vinay S; Kool, Daniel; Lindner, Jörg K N; Brassat, Katharina

Bürger, Julius; Kunnathully, Vinay S; Kool, Daniel; Lindner, Jörg K N; Brassat, Katharina.

Afiliação

Bürger J; 'Nanostructuring, Nanoanalysis and Photonic Materials' Group, Department of Physics, Paderborn University, 33098 Paderborn, Germany.
Kunnathully VS; Institute of Lightweight Design with Hybrid Materials (ILH), 33098 Paderborn, Germany.
Kool D; Center for Optoelectronics and Photonics Paderborn (CeOPP), 33098 Paderborn, Germany.
Lindner JKN; 'Nanostructuring, Nanoanalysis and Photonic Materials' Group, Department of Physics, Paderborn University, 33098 Paderborn, Germany.
Brassat K; Institute of Lightweight Design with Hybrid Materials (ILH), 33098 Paderborn, Germany.

Nanomaterials (Basel) ; 10(1)2020 Jan 13.

Article em En | MEDLINE | ID: mdl-31941037

Palavras-chave

(S)TEM; STEM-EELS of PS and PMMA; block copolymers; line edge roughness LER; nanostructure metrology; polymer interface; self-assembly

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nanomaterials (Basel) Ano de publicação: 2020 Tipo de documento: Article País de afiliação: Alemanha

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google