Focused ion beam preparation of microbeams for in situ mechanical analysis of electroplated nanotwinned copper with probe type indenters.

Robertson, Stuart; Doak, Scott; Sun, Fu-Long; Liu, Zhi-Quan; Liu, Changqing; Zhou, Zhaoxia

Robertson, Stuart; Doak, Scott; Sun, Fu-Long; Liu, Zhi-Quan; Liu, Changqing; Zhou, Zhaoxia.

Afiliação

Robertson S; Department of Materials, Loughborough Materials Characterisation Centre, Loughborough University, Loughborough, U.K.
Doak S; Wolfson School of Mechanical, Electrical and Manufacture Engineering, Loughborough University, Loughborough, LE11 3TU, U.K.
Sun FL; Department of Materials, Loughborough Materials Characterisation Centre, Loughborough University, Loughborough, U.K.
Liu ZQ; Institute of Metal Research, Chinese Academy of Sciences, Shenyang, P.R. China.
Liu C; Institute of Metal Research, Chinese Academy of Sciences, Shenyang, P.R. China.
Zhou Z; Shenzhen Institute of Advanced Electronic Materials, Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen, P.R. China.

J Microsc ; 279(3): 212-216, 2020 Sep.

Article em En | MEDLINE | ID: mdl-31985812

Palavras-chave

Chunk lift-out; P-FIB; focused ion beam; in situ; micromechanical testing; nanotwinned copper

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Microsc Ano de publicação: 2020 Tipo de documento: Article País de afiliação: Reino Unido

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