Atom column detection from simultaneously acquired ABF and ADF STEM images.

Fatermans, J; den Dekker, A J; Müller-Caspary, K; Gauquelin, N; Verbeeck, J; Van Aert, S

Fatermans, J; den Dekker, A J; Müller-Caspary, K; Gauquelin, N; Verbeeck, J; Van Aert, S.

Afiliação

Fatermans J; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Belgium; imec-Vision Lab, University of Antwerp, Universiteitsplein 1, 2610 Wilrijk, Belgium.
den Dekker AJ; imec-Vision Lab, University of Antwerp, Universiteitsplein 1, 2610 Wilrijk, Belgium.
Müller-Caspary K; Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, Forschungszentrum Jülich, 52425 Jülich, Germany.
Gauquelin N; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Belgium.
Verbeeck J; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Belgium.
Van Aert S; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Belgium. Electronic address: Sandra.VanAert@uantwerpen.be.

Ultramicroscopy ; 219: 113046, 2020 Dec.

Article em En | MEDLINE | ID: mdl-32927326

Palavras-chave

Annular bright-field (ABF); Annular dark-field (ADF); Maximum a posteriori (MAP) probability; Scanning transmission electron microscopy (STEM); Statistical parameter estimation

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Revista: Ultramicroscopy Ano de publicação: 2020 Tipo de documento: Article País de afiliação: Bélgica

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