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Spatiotemporal Imaging of Thickness-Induced Band-Bending Junctions.
Wong, Joeson; Davoyan, Artur; Liao, Bolin; Krayev, Andrey; Jo, Kiyoung; Rotenberg, Eli; Bostwick, Aaron; Jozwiak, Chris M; Jariwala, Deep; Zewail, Ahmed H; Atwater, Harry A.
Afiliação
  • Davoyan A; Department of Mechanical and Aerospace Engineering, University of California, Los Angeles, California 90095 United States.
  • Liao B; Department of Mechanical Engineering, University of California, Santa Barbara, California 93106, United States.
  • Krayev A; Horiba Scientific, Novato, California 94949, United States.
  • Jo K; Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States.
  • Rotenberg E; Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720,United States.
  • Bostwick A; Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720,United States.
  • Jozwiak CM; Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720,United States.
  • Jariwala D; Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States.
Nano Lett ; 21(13): 5745-5753, 2021 07 14.
Article em En | MEDLINE | ID: mdl-34152777
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Diagnóstico por Imagem Tipo de estudo: Diagnostic_studies Idioma: En Revista: Nano Lett Ano de publicação: 2021 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Diagnóstico por Imagem Tipo de estudo: Diagnostic_studies Idioma: En Revista: Nano Lett Ano de publicação: 2021 Tipo de documento: Article