Effects of Low Mental Energy from Long Periods of Work on Brain-Computer Interfaces.

Liu, Kaixuan; Yu, Yang; Zeng, Ling-Li; Liang, Xinbin; Liu, Yadong; Chu, Xingxing; Lu, Gai; Zhou, Zongtan

Liu, Kaixuan; Yu, Yang; Zeng, Ling-Li; Liang, Xinbin; Liu, Yadong; Chu, Xingxing; Lu, Gai; Zhou, Zongtan.

Afiliação

Liu K; College of Intelligence Science and Technology, National University of Defense Technology, Changsha 410073, China.
Yu Y; College of Intelligence Science and Technology, National University of Defense Technology, Changsha 410073, China.
Zeng LL; College of Intelligence Science and Technology, National University of Defense Technology, Changsha 410073, China.
Liang X; College of Intelligence Science and Technology, National University of Defense Technology, Changsha 410073, China.
Liu Y; College of Intelligence Science and Technology, National University of Defense Technology, Changsha 410073, China.
Chu X; College of Intelligence Science and Technology, National University of Defense Technology, Changsha 410073, China.
Lu G; College of Intelligence Science and Technology, National University of Defense Technology, Changsha 410073, China.
Zhou Z; College of Intelligence Science and Technology, National University of Defense Technology, Changsha 410073, China.

Brain Sci ; 12(9)2022 Aug 29.

Article em En | MEDLINE | ID: mdl-36138888

Palavras-chave

BCI; electroencephalogram; low mental energy

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Brain Sci Ano de publicação: 2022 Tipo de documento: Article País de afiliação: China

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