Optimal experiment design for element specific atom counting using multiple annular dark field scanning transmission electron microscopy detectors.

Sentürk, D G; De Backer, A; Friedrich, T; Van Aert, S

Sentürk, D G; De Backer, A; Friedrich, T; Van Aert, S.

Afiliação

Sentürk DG; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
De Backer A; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
Friedrich T; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.
Van Aert S; Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium; NANOlab Center of Excellence, University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium. Electronic address: sandra.vanaert@uantwerpen.be.

Ultramicroscopy ; 242: 113626, 2022 Dec.

Article em En | MEDLINE | ID: mdl-36228399

Palavras-chave

4D STEM; Atom-counting; Atomic resolution scanning transmission electron microscopy; Heterogeneous nanostructures; Optimal experiment design

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Ultramicroscopy Ano de publicação: 2022 Tipo de documento: Article País de afiliação: Bélgica

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