X-Ray Diffraction of Ramp-Compressed Silicon to 390 GPa.

Gong, X; Polsin, D N; Paul, R; Henderson, B J; Eggert, J H; Coppari, F; Smith, R F; Rygg, J R; Collins, G W

X-Ray Diffraction of Ramp-Compressed Silicon to 390 GPa.

Gong, X; Polsin, D N; Paul, R; Henderson, B J; Eggert, J H; Coppari, F; Smith, R F; Rygg, J R; Collins, G W.

Afiliação

Gong X; University of Rochester Laboratory for Laser Energetics, Rochester, New York 14623-1299, USA.
Polsin DN; Department of Mechanical Engineering, University of Rochester, Rochester, New York 14627-0132, USA.
Paul R; University of Rochester Laboratory for Laser Energetics, Rochester, New York 14623-1299, USA.
Henderson BJ; Department of Mechanical Engineering, University of Rochester, Rochester, New York 14627-0132, USA.
Eggert JH; University of Rochester Laboratory for Laser Energetics, Rochester, New York 14623-1299, USA.
Coppari F; Department of Mechanical Engineering, University of Rochester, Rochester, New York 14627-0132, USA.
Smith RF; University of Rochester Laboratory for Laser Energetics, Rochester, New York 14623-1299, USA.
Rygg JR; Department of Physics and Astronomy, University of Rochester, Rochester, New York 14627-0171, USA.
Collins GW; Lawrence Livermore National Laboratory, Livermore, California 94550-9234, USA.

Phys Rev Lett ; 130(7): 076101, 2023 Feb 17.

Article em En | MEDLINE | ID: mdl-36867795

ABSTRACT

ABSTRACT

Silicon (Si) exhibits a rich collection of phase transitions under ambient-temperature isothermal and shock compression. This report describes in situ diffraction measurements of ramp-compressed Si between 40 and 389 GPa. Angle-dispersive x-ray scattering reveals that Si assumes an hexagonal close-packed (hcp) structure between 40 and 93 GPa and, at higher pressure, a face-centered cubic structure that persists to at least 389 GPa, the highest pressure for which the crystal structure of Si has been investigated. The range of hcp stability extends to higher pressures and temperatures than predicted by theory.

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Phys Rev Lett Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos

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