Thickness-Dependent Layer Stacking Disorder in Low and High Temperature Phase of MoTe2 via STEM Imaging.

Bhatt, Lopa; Hart, James L; Bianco, Elisabeth; Cha, Judy; Kourkoutis, Lena F

Bhatt, Lopa; Hart, James L; Bianco, Elisabeth; Cha, Judy; Kourkoutis, Lena F.

Afiliação

Bhatt L; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, United States.
Hart JL; Department of Materials Science and Engineering, Cornell University, Ithaca, NY, United States.
Bianco E; Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, United States.
Cha J; Department of Materials Science and Engineering, Cornell University, Ithaca, NY, United States.
Kourkoutis LF; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, United States.

Microsc Microanal ; 29(Supplement_1): 1735-1736, 2023 Jul 22.

Article em En | MEDLINE | ID: mdl-37613765

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microsc Microanal Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos

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