Evolution of Short-Range Order of Amorphous GeTe Upon Structural Relaxation Obtained by TEM Diffractometry and RMC Methods.

Stenz, Christian; Pries, Julian; Surta, T Wesley; Gaultois, Michael W; Wuttig, Matthias

Stenz, Christian; Pries, Julian; Surta, T Wesley; Gaultois, Michael W; Wuttig, Matthias.

Afiliação

Stenz C; Institute of Physics IA, RWTH Aachen University, 52074, Aachen, Germany.
Pries J; Institute of Physics IA, RWTH Aachen University, 52074, Aachen, Germany.
Surta TW; University of Liverpool, Liverpool, L69 3BX, UK.
Gaultois MW; Leverhulme Research Centre for Functional Materials Design, University of Liverpool, Materials Innovation Factory, Liverpool, L69 7ZD, UK.
Wuttig M; Institute of Physics IA, RWTH Aachen University, 52074, Aachen, Germany.

Adv Sci (Weinh) ; 10(36): e2304323, 2023 Dec.

Article em En | MEDLINE | ID: mdl-37908162

Palavras-chave

metavalent bonding; pair distribution function; phase change materials; resistance drift; reverse Monte-Carlo simulation; structural relaxation; structure function; transmission electron microscope diffraction

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Adv Sci (Weinh) Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Alemanha

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