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Dependence-Robust Confidence Intervals for Capture-Recapture Surveys.
Sun, Jinghao; Van Baelen, Luk; Plettinckx, Els; Crawford, Forrest W.
Afiliação
  • Sun J; is a PhD Candidate in Biostatistics at the Yale School of Public Health, New Haven, CT, USA.
  • Van Baelen L; is a Senior Scientist in the Department of Epidemiology and Public Health at the Sciensano, Rue Juliette Wytsmanstraat, 14, Brussels 1050, Belgium.
  • Plettinckx E; is a Principal Research Scientist at the Department of Epidemiology and Public Health at the Sciensano, Rue Juliette Wytsmanstraat, 14, Brussels 1050, Belgium.
  • Crawford FW; is an Associate Professor of Biostatistics, Statistics & Data Science, Operations, and Ecology & Evolutionary Biology at the Yale University, New Haven, CT, USA.
J Surv Stat Methodol ; 11(5): 1133-1154, 2023 Nov.
Article em En | MEDLINE | ID: mdl-37975066

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Surv Stat Methodol Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Surv Stat Methodol Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Estados Unidos