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Understanding how junction resistances impact the conduction mechanism in nano-networks.
Gabbett, Cian; Kelly, Adam G; Coleman, Emmet; Doolan, Luke; Carey, Tian; Synnatschke, Kevin; Liu, Shixin; Dawson, Anthony; O'Suilleabhain, Domhnall; Munuera, Jose; Caffrey, Eoin; Boland, John B; Sofer, Zdenek; Ghosh, Goutam; Kinge, Sachin; Siebbeles, Laurens D A; Yadav, Neelam; Vij, Jagdish K; Aslam, Muhammad Awais; Matkovic, Aleksandar; Coleman, Jonathan N.
Afiliação
  • Gabbett C; School of Physics, CRANN & AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.
  • Kelly AG; School of Physics, CRANN & AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.
  • Coleman E; i3N/CENIMAT, Faculty of Science and Technology, Universidade NOVA de Lisboa, Campus de Caparica, 2829-516, Caparica, Portugal.
  • Doolan L; School of Physics, CRANN & AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.
  • Carey T; School of Physics, CRANN & AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.
  • Synnatschke K; School of Physics, CRANN & AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.
  • Liu S; School of Physics, CRANN & AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.
  • Dawson A; School of Physics, CRANN & AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.
  • O'Suilleabhain D; School of Physics, CRANN & AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.
  • Munuera J; School of Physics, CRANN & AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.
  • Caffrey E; School of Physics, CRANN & AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.
  • Boland JB; Department of Physics, Faculty of Sciences, University of Oviedo, C/ Leopoldo Calvo Sotelo, 18, 33007, Oviedo, Asturias, Spain.
  • Sofer Z; School of Physics, CRANN & AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.
  • Ghosh G; School of Physics, CRANN & AMBER Research Centres, Trinity College Dublin, Dublin 2, Ireland.
  • Kinge S; Department of Inorganic Chemistry, University of Chemistry and Technology Prague, Technická 5, Prague 6, 166 28, Czech Republic.
  • Siebbeles LDA; Chemical Engineering Department, Delft University of Technology, Van der Maasweg 9, NL-2629, HZ, Delft, The Netherlands.
  • Yadav N; Materials Research & Development, Toyota Motor Europe, B1930, Zaventem, Belgium.
  • Vij JK; Chemical Engineering Department, Delft University of Technology, Van der Maasweg 9, NL-2629, HZ, Delft, The Netherlands.
  • Aslam MA; Department of Electronic & Electrical Engineering, Trinity College Dublin 2, Dublin 2, Ireland.
  • Matkovic A; Department of Electronic & Electrical Engineering, Trinity College Dublin 2, Dublin 2, Ireland.
  • Coleman JN; Chair of Physics, Department Physics, Mechanics and Electrical Engineering, Montanuniversität Leoben, Franz Josef Strasse 18, 8700, Leoben, Austria.
Nat Commun ; 15(1): 4517, 2024 May 28.
Article em En | MEDLINE | ID: mdl-38806479
ABSTRACT
Networks of nanowires, nanotubes, and nanosheets are important for many applications in printed electronics. However, the network conductivity and mobility are usually limited by the resistance between the particles, often referred to as the junction resistance. Minimising the junction resistance has proven to be challenging, partly because it is difficult to measure. Here, we develop a simple model for electrical conduction in networks of 1D or 2D nanomaterials that allows us to extract junction and nanoparticle resistances from particle-size-dependent DC network resistivity data. We find junction resistances in porous networks to scale with nanoparticle resistivity and vary from 5 Ω for silver nanosheets to 24 GΩ for WS2 nanosheets. Moreover, our model allows junction and nanoparticle resistances to be obtained simultaneously from AC impedance spectra of semiconducting nanosheet networks. Through our model, we use the impedance data to directly link the high mobility of aligned networks of electrochemically exfoliated MoS2 nanosheets (≈ 7 cm2 V-1 s-1) to low junction resistances of ∼2.3 MΩ. Temperature-dependent impedance measurements also allow us to comprehensively investigate transport mechanisms within the network and quantitatively differentiate intra-nanosheet phonon-limited bandlike transport from inter-nanosheet hopping.

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nat Commun Assunto da revista: BIOLOGIA / CIENCIA Ano de publicação: 2024 Tipo de documento: Article País de afiliação: Irlanda

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nat Commun Assunto da revista: BIOLOGIA / CIENCIA Ano de publicação: 2024 Tipo de documento: Article País de afiliação: Irlanda