Detection of X-rays and electron energy loss events in time coincidence.

ABSTRACT

Experiments are described in which characteristic X-rays are detected in coincidence with the electron energy losses that are responsible for these X-rays. The possibility to use this technique for improving the detection limits of microanalysis is evaluated. It is concluded that, because of the occurrence of false coincidences, better than the state-of-the-art instrumentation will be required for most practical applications.