Orbital reflectometry of oxide heterostructures.

The occupation of d orbitals controls the magnitude and anisotropy of the inter-atomic electron transfer in transition-metal oxides and hence exerts a key influence on their chemical bonding and physical properties. Atomic-scale modulations of the orbital occupation at surfaces and interfaces are believed to be responsible for massive variations of the magnetic and transport properties, but could not thus far be probed in a quantitative manner. Here we show that it is possible to derive quantitative, spatially resolved orbital polarization profiles from soft-X-ray reflectivity data, without resorting to model calculations. We demonstrate that the method is sensitive enough to resolve differences of ~3% in the occupation of Ni e(g) orbitals in adjacent atomic layers of a LaNiO(3)-LaAlO(3) superlattice, in good agreement with ab initio electronic-structure calculations. The possibility to quantitatively correlate theory and experiment on the atomic scale opens up many new perspectives for orbital physics in transition-metal oxides.

Interface-induced modulation of charge and polarization in thin film Fe(3)O(4).

Charge and polarization modulations in Fe3 O4 are controlled by taking advantage of interfacial strain effects. The feasibility of oxidation state control by strain modification is demonstrated and it is shown that this approach offers a stable configuration at room temperature. Direct evidence of how a local strain field changes the atomic coordination and introduces atomic displacements leading to polarization of Fe ions is presented.

Element specific monolayer depth profiling.

The electronic phase behavior and functionality of interfaces and surfaces in complex materials are strongly correlated to chemical composition profiles, stoichiometry and intermixing. Here a novel analysis scheme for resonant X-ray reflectivity maps is introduced to determine such profiles, which is element specific and non-destructive, and which exhibits atomic-layer resolution and a probing depth of hundreds of nanometers.

Investigation on the Residual Stress State of Drawn Tubes by Numerical Simulation and Neutron Diffraction Analysis.

Cold drawing is widely applied in the industrial production of seamless tubes, employed for various mechanical applications. During pre-processing, deviations in tools and their adjustment lead to inhomogeneities in the geometry of the tubes and cause a gradient in residuals. In this paper a three dimensional finite element (3D-FE)-model is presented which was developed to calculate the change in wall thickness, eccentricity, ovality and residual macro-stress state of the tubes, produced by cold drawing. The model simulates the drawing process of tubes, drawn with and without a plug. For finite element modelling, the commercial software package Abaqus was used. To validate the model, neutron strain imaging measurements were performed on the strain imaging instrument SALSA at the Institute Laue Langevin (ILL, Grenoble, France) on a series of SF-copper tubes, drawn under controlled laboratory conditions, varying the drawing angle and the plug geometry. It can be stated that there is sufficient agreement between the finite element method (FEM)-calculation and the neutron stress determination.

An advanced magnetic reflectometer.

A new experimental setup dedicated to the measurement of soft-x-ray magnetic absorption spectroscopy and soft-x-ray resonant magnetic reflectometry (soft-XRMR) is presented. XRMR is the combination of standard x-ray reflectometry with x-ray magnetic circular dichroism which provides chemical and magnetic depth profiles of layered thin-film samples. This new diffractometer is optimized for a broad variety of sample systems. Therefore a balanced design focusing on high magnetic fields, low temperatures, and full freedom of rotation has been realized in UHV. First experimental results obtained on a NiCoO/Co bilayer sample are presented showing the potential of the setup.

Uncompensated moments in the MnPd/Fe exchange bias system.

The element-specific magnetic structure of an epitaxially grown Mn_52Pd_48/Fe bilayer showing exchange bias was investigated with atomic-layer depth sensitivity at the antiferromagnet/ferromagnet interface by soft-x-ray magnetic circular dichroism and magnetic reflectivity. A complex magnetic interfacial configuration, consisting of a 2-monolayer-thick induced ferromagnetic region, and pinned uncompensated Mn moments that reach far deeper (approximately 13 A), both in the antiferromagnet, were found. For the latter, a direct relationship with the magnitude of the exchange bias is verified by similar measurements perpendicular to the field cooling direction.