Inverse-problem approach for particle digital holography: accurate location based on local optimization.

We propose a microparticle localization scheme in digital holography. Most conventional digital holography methods are based on Fresnel transform and present several problems such as twin-image noise, border effects, and other effects. To avoid these difficulties, we propose an inverse-problem approach, which yields the optimal particle set that best models the observed hologram image. We resolve this global optimization problem by conventional particle detection followed by a local refinement for each particle. Results for both simulated and real digital holograms show strong improvement in the localization of the particles, particularly along the depth dimension. In our simulations, the position precision is > or =1 microm rms. Our results also show that the localization precision does not deteriorate for particles near the edge of the field of view.

Inverse problem approach in particle digital holography: out-of-field particle detection made possible.

We propose a microparticle detection scheme in digital holography. In our inverse problem approach, we estimate the optimal particles set that best models the observed hologram image. Such a method can deal with data that have missing pixels. By considering the camera as a truncated version of a wider sensor, it becomes possible to detect particles even out of the camera field of view. We tested the performance of our algorithm against simulated and experimental data for diluted particle conditions. With real data, our algorithm can detect particles far from the detector edges in a working area as large as 16 times the camera field of view. A study based on simulated data shows that, compared with classical methods, our algorithm greatly improves the precision of the estimated particle positions and radii. This precision does not depend on the particle's size or location (i.e., whether inside or outside the detector field of view).