Accelerating Innovation that Enhances Resource Recovery in the Wastewater Sector: Advancing a National Testbed Network.

This Feature examines significant challenges and opportunities to spur innovation and accelerate adoption of reliable technologies that enhance integrated resource recovery in the wastewater sector through the creation of a national testbed network. The network is a virtual entity that connects appropriate physical testing facilities, and other components needed for a testbed network, with researchers, investors, technology providers, utilities, regulators, and other stakeholders to accelerate the adoption of innovative technologies and processes that are needed for the water resource recovery facility of the future. Here we summarize and extract key issues and developments, to provide a strategy for the wastewater sector to accelerate a path forward that leads to new sustainable water infrastructures.

A dissolution-diffusion model for the TAXUS drug-eluting stent with surface burst estimated from continuum percolation.

A two-layer dissolution-diffusion model is derived which incorporates a surface burst component that is estimated from continuum percolation models of overlapping Poisson distributed spheres. The model is shown to adequately describe the release properties of paclitaxel from a hydrophobic polymer matrix, including the surface burst and sustained release dependence on drug loading.

Surface and depth profiling investigation of a drug-loaded copolymer utilized to coat taxus express2 stents.

The surface of a styrene-b-isobutylene-b-styrene triblock copolymer, containing a solid-phase drug, was studied by time-of-flight secondary ion mass spectrometry employing 15-keV Ga+ and 20-keV C60+ ion sources. This polymer/drug system has direct application in the cardiac stent arena, where it has been used to treat restenosis or renarrowing of arterial walls after stent or angioplasty procedures. Overall, the results illustrate the successful use of a cluster ion beam for greatly enhancing the high-mass fragment ion and molecular ion intensities from the surface and bulk of the polymer system. The use of C60+ also established the ability to remove common overlayers like poly(dimethylsiloxane), which was not possible using a Ga+ ion source. Furthermore, the use of C60+ allowed depth profiles to be obtained using primary ion dose densities in excess of 6 x 1014 C60+/cm2. Resultant sputter craters reached depths of approximately 2 microm and possessed relatively flat bottoms without the need for sample rotation. AFM and profilometry studies support the relatively gentile removal of surface species via phase contrast and topographic imaging. In addition, the findings suggest that relatively high ion doses do not significantly alter the phase distribution or surface topography of the polymer surface; however, a slight increase in surface roughness was detected.