RESUMEN
The structural and electronic origins of the interactions between polycarbonate and sputter deposited TiAlN were analysed using a combined electron and force spectroscopic approach. Interaction forces were measured by means of dynamic force spectroscopy and the surface polarizability was analysed by X-ray photoelectron valence band spectroscopy. It could be shown that the adhesive interactions between polycarbonate and TiAlN are governed by van der Waals forces. Different surface cleansing and oxidizing treatments were investigated and the effect of the surface chemistry on the force interactions was analysed. Intense surface oxidation resulted in a decreased adhesion force by a factor of two due to the formation of a 2 nm thick Ti0.21Al0.45O surface oxide layer. The origin of the residual adhesion forces caused by the mixed Ti0.21Al0.45O surface oxide was clarified by considering the non-retarded Hamaker coefficients as calculated by Lifshitz theory, based on optical data from Reflection Electron Energy Loss Spectroscopy. This disclosed increased dispersion forces of Ti0.21Al0.45O due to the presence of Ti(iv) ions and related Ti 3d band optical transitions.
RESUMEN
We have characterized the thickness and effective refractive index of carbon nanotube forests by fitting reflectance measurements in the visible and near infrared ranges. The measurements were performed with polarized light. An effective medium layer consisting of a mixture of graphite and air was used to simulate the nanotube film. The proposed model accurately described the behaviour of the reflected s-polarized component (Rs), which allowed for the precise determination of the thickness and porosity of the films, in very good agreement with SEM measurements of film thickness. The p-polarized component (Rp), on the other hand, could not be described in terms of the developed model. In badly aligned samples, where there is a mixture of Rs and Rp behaviour, the model fails to fit the Rs component as well. This effect can therefore be taken as an indirect indication of lack of alignment in the samples.