Towards RIP using free-electron laser SFX data.
J Synchrotron Radiat
; 22(2): 249-55, 2015 Mar.
Article
en En
| MEDLINE
| ID: mdl-25723926
ABSTRACT
Here, it is shown that simulated native serial femtosecond crystallography (SFX) cathepsin B data can be phased by rapid ionization of sulfur atoms. Utilizing standard software adopted for radiation-damage-induced phasing (RIP), the effects on both substructure determination and phasing of the number of collected patterns and fluences are explored for experimental conditions already available at current free-electron laser facilities.
Palabras clave
Texto completo:
1
Banco de datos:
MEDLINE
Asunto principal:
Conformación Proteica
/
Traumatismos por Radiación
/
Cristalografía por Rayos X
Tipo de estudio:
Diagnostic_studies
Límite:
Humans
Idioma:
En
Revista:
J Synchrotron Radiat
Asunto de la revista:
RADIOLOGIA
Año:
2015
Tipo del documento:
Article
País de afiliación:
Alemania