Conductive-AFM Patterning of Organic Semiconductors.
Small
; 11(38): 5054-8, 2015 Oct.
Article
en En
| MEDLINE
| ID: mdl-26222541
ABSTRACT
Using a conductive atomic force microscope (c-AFM) redox-writing technique, it is shown that it is possible to locally, and reversibly, pattern conducting, and nonconducting features on the surface of a low molecular weight aniline-based organic (semi)-conductor thin film using a commercial c-AFM. It is shown that application of a voltage between the tip and sample causes localized redox reactions at the surface without damage.
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Banco de datos:
MEDLINE
Idioma:
En
Revista:
Small
Asunto de la revista:
ENGENHARIA BIOMEDICA
Año:
2015
Tipo del documento:
Article
País de afiliación:
Reino Unido