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Bayesian inference of metal oxide ultrathin film structure based on crystal truncation rod measurements.
Anada, Masato; Nakanishi-Ohno, Yoshinori; Okada, Masato; Kimura, Tsuyoshi; Wakabayashi, Yusuke.
Afiliación
  • Anada M; Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan.
  • Nakanishi-Ohno Y; Graduate School of Arts and Sciences, The University of Tokyo, 3-8-1 Komaba, Meguro, Tokyo 153-8902, Japan.
  • Okada M; Graduate School of Frontier Sciences, The University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, Chiba 277-8561, Japan.
  • Kimura T; Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan.
  • Wakabayashi Y; Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka 560-8531, Japan.
J Appl Crystallogr ; 50(Pt 6): 1611-1616, 2017 Dec 01.
Article en En | MEDLINE | ID: mdl-29217989
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Texto completo: 1 Banco de datos: MEDLINE Idioma: En Revista: J Appl Crystallogr Año: 2017 Tipo del documento: Article País de afiliación: Japón
Texto completo
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Revista: J Appl Crystallogr Año: 2017 Tipo del documento: Article País de afiliación: Japón