Implementing time resolved electron temperature capability at the NIF using a streak camera.

Khan, S F; Jarrott, L C; Patel, P K; Izumi, N; Ma, T; MacPhee, A G; Hatch, B; Landen, O L; Heinmiller, J; Kilkenny, J D; Bradley, D K

Khan, S F; Jarrott, L C; Patel, P K; Izumi, N; Ma, T; MacPhee, A G; Hatch, B; Landen, O L; Heinmiller, J; Kilkenny, J D; Bradley, D K.

Afiliación

Khan SF; Lawrence Livermore National Laboratory, Livermore, California 94550, USA.
Jarrott LC; Lawrence Livermore National Laboratory, Livermore, California 94550, USA.
Patel PK; Lawrence Livermore National Laboratory, Livermore, California 94550, USA.
Izumi N; Lawrence Livermore National Laboratory, Livermore, California 94550, USA.
Ma T; Lawrence Livermore National Laboratory, Livermore, California 94550, USA.
MacPhee AG; Lawrence Livermore National Laboratory, Livermore, California 94550, USA.
Hatch B; Lawrence Livermore National Laboratory, Livermore, California 94550, USA.
Landen OL; Lawrence Livermore National Laboratory, Livermore, California 94550, USA.
Heinmiller J; Nevada National Security Site, Livermore, California 94551, USA.
Kilkenny JD; General Atomics, San Diego, California 92121, USA.
Bradley DK; Lawrence Livermore National Laboratory, Livermore, California 94550, USA.

Rev Sci Instrum ; 89(10): 10K117, 2018 Oct.

Article en En | MEDLINE | ID: mdl-30399814

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Texto completo: 1 Banco de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Rev Sci Instrum Año: 2018 Tipo del documento: Article País de afiliación: Estados Unidos

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