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Differentiating between stress- and EPT-induced electrodermal activity during dental examination.
Kong, Youngsun; Posada-Quintero, Hugo F; Tran, Hanh; Talati, Ankur; Acquista, Thomas J; Chen, I-Ping; Chon, Ki H.
Afiliación
  • Kong Y; Biomedical Engineering, University of Connecticut, Storrs, CT, 06269, USA. Electronic address: youngsun.kong@uconn.edu.
  • Posada-Quintero HF; Biomedical Engineering, University of Connecticut, Storrs, CT, 06269, USA.
  • Tran H; Department of Oral Health and Diagnostic Sciences, University of Connecticut Health, Farmington, CT, 06032, USA.
  • Talati A; Department of Oral Health and Diagnostic Sciences, University of Connecticut Health, Farmington, CT, 06032, USA.
  • Acquista TJ; Biomedical Engineering, University of Connecticut, Storrs, CT, 06269, USA.
  • Chen IP; Department of Oral Health and Diagnostic Sciences, University of Connecticut Health, Farmington, CT, 06032, USA.
  • Chon KH; Biomedical Engineering, University of Connecticut, Storrs, CT, 06269, USA.
Comput Biol Med ; 155: 106695, 2023 03.
Article en En | MEDLINE | ID: mdl-36805230

Texto completo: 1 Banco de datos: MEDLINE Asunto principal: Dolor / Respuesta Galvánica de la Piel Límite: Humans Idioma: En Revista: Comput Biol Med Año: 2023 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Asunto principal: Dolor / Respuesta Galvánica de la Piel Límite: Humans Idioma: En Revista: Comput Biol Med Año: 2023 Tipo del documento: Article