Your browser doesn't support javascript.
loading
A Novel Super-Junction DT-MOS with Floating p Regions to Improve Short-Circuit Ruggedness.
Yin, Sujie; Cao, Wei; Hu, Xiarong; Ge, Xinglai; Liu, Dong.
Afiliación
  • Yin S; School of Electrical Engineering, Southwest Jiaotong University, Chengdu 611756, China.
  • Cao W; School of Electrical Engineering, Southwest Jiaotong University, Chengdu 611756, China.
  • Hu X; School of Science, Xihua University, Chengdu 610039, China.
  • Ge X; School of Electrical Engineering, Southwest Jiaotong University, Chengdu 611756, China.
  • Liu D; School of Electrical Engineering, Southwest Jiaotong University, Chengdu 611756, China.
Micromachines (Basel) ; 14(10)2023 Oct 21.
Article en En | MEDLINE | ID: mdl-37893399
Palabras clave
Texto completo
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Revista: Micromachines (Basel) Año: 2023 Tipo del documento: Article País de afiliación: China
Texto completo
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Revista: Micromachines (Basel) Año: 2023 Tipo del documento: Article País de afiliación: China