Terahertz Time-Domain Polarimetry in Reflection for Film Characterization.

Terahertz time-domain spectroscopy is a useful technique to characterize layered samples and thin films. It gives access to their optical properties and thickness. Such measurements are done in transmission, which requires access to the sample from opposite sides. In reality this is not always possible. In such cases, reflection measurements are the only option, but they are more difficult to implement. Here we propose a method to characterize films in reflection geometry using a polarimetric approach based on the identification of Brewster angle and modeling of the measured signal to extract the refractive index and thickness of the sample. The technique is demonstrated experimentally on an unsupported single layer thin film sample. The extracted optical properties and thickness were in good agreement with established transmission terahertz spectroscopy measurements. The new method has the potential to cover a wide range of applications, both for research and industrial purposes.

Advanced birefringence measurements in standard terahertz time-domain spectroscopy.

Polarization-sensitive (PS) terahertz (THz) technology can be used for investigating anisotropic materials that are opaque for visible light. A full characterization of an anisotropic material requires the extraction of the birefringence as well as the orientation of the optical axis from the measurement data. We present an approach based on THz time-domain spectroscopy (TDS) that exploits the spectral content of the THz signal for determining these two parameters from only two measurements. In contrast to an earlier approach with a more sophisticated PS-THz system and quasi-circularly polarized THz radiation, now a simple standard THz-TDS system can be employed. After a description of the mathematical model for data analysis we demonstrate the applicability of our method for a lithium niobate crystal and furthermore for a glass-fiber reinforced polymer sample, for which the orientation of the optical axis and birefringence are obtained in a spatially resolved way, showing the potential of the method also for PS-THz imaging. As no specialized setup or components are required, our approach can be easily and extensively applied for the analysis of anisotropic samples at THz frequencies.

Polarization sensitive terahertz imaging: detection of birefringence and optical axis.

We present a practicable way to take advantage of the spectral information contained in a broadband terahertz pulse for the determination of birefringence and orientation of the optical axis in a glass fiber reinforced polymer with a single measurement. Our setup employs circularly polarized terahertz waves and a polarization-sensitive detector to measure both components of the electromagnetic field simultaneously. The anisotropic optical parameters are obtained from an analysis of the phase and frequency resolved components of the terahertz field. This method shows a high tolerance against the skew of the detection axes and is also independent of a reference measurement.

Efficient terahertz en-face imaging.

In this work, we develop a pulsed terahertz imaging system in reflection geometry, where due to scanning of the terahertz beam neither the sample nor the emitter and detector have to be moved. We use a two mirror galvanoscanner for deflecting the beam, in combination with a single rotationally symmetric focusing lens. In order to efficiently image planar structures, we develop an advanced scanning routine that resolves all bending effects of the imaging plane already during measurement. Thus, the measurement time is reduced, and efficient imaging of surfaces and interfaces becomes possible. We demonstrate the potential of this method in particular for a plastic-metal composite sample, for which non-destructive evaluation of an interface is performed.