RESUMEN
Practically all thin film systems for normal incidence can be realized using only two-layer materials. But for oblique incidence, polarization effects occur, designs may become complex, and polarization control is difficult or impossible to achieve. Here multi-index or gradient designs offer additional degrees of freedom, and can simplify or even enable challenging designs. Such gradient thin film stacks can be designed ab initio without any start or index profile approximations using a new design software developed by Carl Zeiss. With this software, a rugate omnidirectional AR coating was calculated and transferred to three different multi-index systems. All three examples were realized using ion beam sputter technology, and characterized at Laser Zentrum Hannover. Here we present comparative measurements of the optical performance together with femtosecond laser-induced damage threshold measurements.
RESUMEN
We formulate the problem of designing gradient-index optical coatings as the task of solving a system of operator equations. We use iterative numerical procedures known from the theory of inverse problems to solve it with respect to the coating refractive index profile and thickness. The mathematical derivations necessary for the application of the procedures are presented, and different numerical methods (Landweber, Newton, and Gauss-Newton methods, Tikhonov minimization with surrogate functionals) are implemented. Procedures for the transformation of the gradient coating designs into quasi-gradient ones (i.e., multilayer stacks of homogeneous layers with different refractive indices) are also developed. The design algorithms work with physically available coating materials that could be produced with the modern coating technologies.
Asunto(s)
Algoritmos , Lentes , Modelos Teóricos , Análisis Numérico Asistido por Computador , Refractometría/instrumentación , Propiedades de Superficie , Simulación por Computador , Diseño de Equipo , Análisis de Falla de EquipoRESUMEN
Recent progress in ellipsometry instrumentation permits precise measurement and characterization of optical coating materials in the deep-UV wavelength range. Dielectric coating materials exhibit their first electronic interband transition in this spectral range. The Tauc-Lorentz model is a powerful tool with which to parameterize interband absorption above the band edge. The application of this model for the parameterization of the optical absorption of TiO2, Ta2O5, HfO2, Al2O3, and LaF3 thin-film materials is described.