Unravelling highly oxidized nickel centers in the anodic black film formed during the Simons process by in situ X-ray absorption near edge structure spectroscopy.

The Simons process is an electrochemical fluorination method to prepare organofluorine compounds. Despite the wide application, the underlying mechanism is still unclear. We report the investigation of the black film formed on the surface of the anodes in aHF by an in situ Ni K-edge X-ray absorption near edge structure (XANES) investigation. An electrochemical cell for in situ X-ray absorption spectroscopy (XAS) is presented.