Determination of surface profile statistics from electromagnetic scattering data.

A new reverse Monte Carlo method for the determination of the surface profile statistics from differential reflection data for the scattering of electromagnetic radiation from rough surfaces is presented. The method is used to extract the power spectrum of the surface profile from scattering data recently measured by West and O'Donnell [J. Opt. Soc. Am. A 12, 390 (1995)]. Excellent agreement with the power spectrum of the surface profile measured by contact profilometry is obtained.

Speckle correlations in the light scattered from a weakly rough one-dimensional random metal surface.

Perturbation theory is used to compute the angular-intensity correlation function C(q, k|q(?), k(?)) = ?[I(q|k) - ?I(q|k)?][I(q(?)|k(?)) - ?I(q(?)|k(?))]? for p-polarized light scattered from a weakly rough, one-dimensional random metal surface. I(q|k) is the squared modulus of the scattering matrix for the system, and q , q(?) and k , k(?) are the projections on the mean scattering surface of the wave vectors of the scattered and the incident light, respectively. Contributions to C include (a) short-range memory effect and time-reversed memory effect terms, C((1)) ; (b) an additional short-range term of comparable magnitude C((10)) ; (c) a long-range term C((2)) ; (d) an infinite-range term C((3)) ; and (e) a new term C((1.5)) that along with C((2)) displays peaks associated with the excitation of surface polaritons. These new features arise when the factorization approximation is not made in calculating the correlation function C .