RESUMO
The influence of growth interruption on the surface and luminescence properties of AlGaN/GaN ultraviolet multi-quantum wells (UV MQWs) is investigated. It is found that when the well and barrier layers of MQW samples are continuously grown at the same temperature, they have lower edge dislocation density and flatter surface of MQWs compared to samples with interrupted well and barrier growth. Moreover, continuous growth of well and barrier layers is more conducive to improving the luminescence efficiency of MQWs. This phenomenon is attributed to more impurity incorporation induced by the growth interruption, while a continuous growth of well and barrier can reduce surface diffusion and migration processes of atoms, reducing the defects and surface roughness of MQWs. In addition, the continuous growth of well and barrier can better control the reaction between Al and N atoms, avoiding the formation of excessively high Al content AlGaN at the well/barrier interface, thus improving the luminescence of UV MQWs.
RESUMO
Temperature characteristics of near-UV laser diodes (LDs) with a lasing wavelength of 384â nm are investigated. The characteristic temperature of threshold current (T0) of the UV LDs is low. Thus, the performance of the UV LDs under continuous wave (CW) operation is not as good as under pulsed operation especially at a high injection current. In addition, it is found that self-heating is a key factor for CW characteristics of the UV LDs, where suppression of the self-heating by using thick waveguide layers can increase the critical current of thermal rollover of the UV LD's operation. A high CW output power of 2.0â W is achieved for an InGaN near-UV LD with the n-side down on a sub-mount, whose threshold current density is 1.27â kA/cm2 and the highest wall plug efficiency (WPE) is approximately 15.9% at an injection current of 1.2â A.