Defect-free erbium silicide formation using an ultrathin Ni interlayer.
ACS Appl Mater Interfaces
; 6(16): 14712-7, 2014 Aug 27.
Article
in En
| MEDLINE
| ID: mdl-25093916
Full text:
1
Database:
MEDLINE
Language:
En
Journal:
ACS Appl Mater Interfaces
Journal subject:
BIOTECNOLOGIA
/
ENGENHARIA BIOMEDICA
Year:
2014
Type:
Article