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Nanomaterial datasets to advance tomography in scanning transmission electron microscopy.
Levin, Barnaby D A; Padgett, Elliot; Chen, Chien-Chun; Scott, M C; Xu, Rui; Theis, Wolfgang; Jiang, Yi; Yang, Yongsoo; Ophus, Colin; Zhang, Haitao; Ha, Don-Hyung; Wang, Deli; Yu, Yingchao; Abruña, Hector D; Robinson, Richard D; Ercius, Peter; Kourkoutis, Lena F; Miao, Jianwei; Muller, David A; Hovden, Robert.
Affiliation
  • Levin BD; School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA.
  • Padgett E; School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA.
  • Chen CC; Department of Physics &Astronomy, and California NanoSystems Institute, University of California, Los Angeles, California 90095, USA.
  • Scott MC; Department of Physics, National Sun Yat-Sen University, Kaohsiung 80424, Taiwan.
  • Xu R; Department of Physics &Astronomy, and California NanoSystems Institute, University of California, Los Angeles, California 90095, USA.
  • Theis W; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.
  • Jiang Y; Department of Physics &Astronomy, and California NanoSystems Institute, University of California, Los Angeles, California 90095, USA.
  • Yang Y; Nanoscale Physics Research Laboratory, School of Physics and Astronomy, University of Birmingham, Edgbaston, Birmingham B15 2TT, UK.
  • Ophus C; Department of Physics, Cornell University, Ithaca, New York 14853, USA.
  • Zhang H; Department of Physics &Astronomy, and California NanoSystems Institute, University of California, Los Angeles, California 90095, USA.
  • Ha DH; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.
  • Wang D; Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA.
  • Yu Y; Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA.
  • Abruña HD; Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853, USA.
  • Robinson RD; School of Chemistry and Chemical Engineering, Huazhong University of Science and Technology, Wuhan 430074, China.
  • Ercius P; Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853, USA.
  • Kourkoutis LF; Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853, USA.
  • Miao J; Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA.
  • Muller DA; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA.
  • Hovden R; School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA.
Sci Data ; 3: 160041, 2016 06 07.
Article in En | MEDLINE | ID: mdl-27272459
Electron tomography in materials science has flourished with the demand to characterize nanoscale materials in three dimensions (3D). Access to experimental data is vital for developing and validating reconstruction methods that improve resolution and reduce radiation dose requirements. This work presents five high-quality scanning transmission electron microscope (STEM) tomography datasets in order to address the critical need for open access data in this field. The datasets represent the current limits of experimental technique, are of high quality, and contain materials with structural complexity. Included are tomographic series of a hyperbranched Co2P nanocrystal, platinum nanoparticles on a carbon nanofibre imaged over the complete 180° tilt range, a platinum nanoparticle and a tungsten needle both imaged at atomic resolution by equal slope tomography, and a through-focal tilt series of PtCu nanoparticles. A volumetric reconstruction from every dataset is provided for comparison and development of post-processing and visualization techniques. Researchers interested in creating novel data processing and reconstruction algorithms will now have access to state of the art experimental test data.
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Full text: 1 Database: MEDLINE Main subject: Microscopy, Electron, Scanning Transmission / Electron Microscope Tomography Language: En Journal: Sci Data Year: 2016 Type: Article Affiliation country: United States
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Full text: 1 Database: MEDLINE Main subject: Microscopy, Electron, Scanning Transmission / Electron Microscope Tomography Language: En Journal: Sci Data Year: 2016 Type: Article Affiliation country: United States