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IR sensitivity enhancement of CMOS Image Sensor with diffractive light trapping pixels.
Yokogawa, Sozo; Oshiyama, Itaru; Ikeda, Harumi; Ebiko, Yoshiki; Hirano, Tomoyuki; Saito, Suguru; Oinoue, Takashi; Hagimoto, Yoshiya; Iwamoto, Hayato.
Affiliation
  • Yokogawa S; Sony Semiconductor Solutions Corporation, Atsugi Tec., 4-14-1 Asahi-cho, Atsugi, Kanagawa, 243-0014, Japan. Sozo.Yokogawa@sony.com.
  • Oshiyama I; Sony Semiconductor Solutions Corporation, Atsugi Tec., 4-14-1 Asahi-cho, Atsugi, Kanagawa, 243-0014, Japan.
  • Ikeda H; Sony Semiconductor Solutions Corporation, Atsugi Tec., 4-14-1 Asahi-cho, Atsugi, Kanagawa, 243-0014, Japan.
  • Ebiko Y; Sony Semiconductor Solutions Corporation, Atsugi Tec., 4-14-1 Asahi-cho, Atsugi, Kanagawa, 243-0014, Japan.
  • Hirano T; Sony Semiconductor Solutions Corporation, Atsugi Tec., 4-14-1 Asahi-cho, Atsugi, Kanagawa, 243-0014, Japan.
  • Saito S; Sony Semiconductor Solutions Corporation, Atsugi Tec., 4-14-1 Asahi-cho, Atsugi, Kanagawa, 243-0014, Japan.
  • Oinoue T; Sony Semiconductor Solutions Corporation, Atsugi Tec., 4-14-1 Asahi-cho, Atsugi, Kanagawa, 243-0014, Japan.
  • Hagimoto Y; Sony Semiconductor Solutions Corporation, Atsugi Tec., 4-14-1 Asahi-cho, Atsugi, Kanagawa, 243-0014, Japan.
  • Iwamoto H; Sony Semiconductor Solutions Corporation, Atsugi Tec., 4-14-1 Asahi-cho, Atsugi, Kanagawa, 243-0014, Japan.
Sci Rep ; 7(1): 3832, 2017 06 19.
Article in En | MEDLINE | ID: mdl-28630442
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Full text: 1 Database: MEDLINE Type of study: Diagnostic_studies Language: En Journal: Sci Rep Year: 2017 Type: Article Affiliation country: Japan
Fulltext
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Full text: 1 Database: MEDLINE Type of study: Diagnostic_studies Language: En Journal: Sci Rep Year: 2017 Type: Article Affiliation country: Japan