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New levels of high angular resolution EBSD performance via inverse compositional Gauss-Newton based digital image correlation.
Ruggles, T J; Bomarito, G F; Qiu, R L; Hochhalter, J D.
Affiliation
  • Ruggles TJ; National Institute of Aerospace, 100 Exploration Way, Hampton, VA 23666, USA. Electronic address: timothy.ruggles@nasa.gov.
  • Bomarito GF; National Air and Space Administration, Hampton, VA 23666, USA.
  • Qiu RL; Roanoke Valley Governor's School for Science and Technology, Roanoke, VA 24015, USA.
  • Hochhalter JD; National Air and Space Administration, Hampton, VA 23666, USA.
Ultramicroscopy ; 195: 85-92, 2018 12.
Article in En | MEDLINE | ID: mdl-30216795
Conventional high angular resolution electron backscatter diffraction (HREBSD) uses cross-correlation to track features between diffraction patterns, which are then related to the relative elastic strain and misorientation between the diffracting volumes of material. This paper adapts inverse compositional Gauss Newton (ICGN) digital image correlation (DIC) to be compatible with HREBSD. ICGN-based works by efficiently tracking not just the shift in features, but also the change in their shape. Modeling a shape change as well as a shift results in greater accuracy. This method, ICGN-based HREBSD, is applied to a simulated data set, and its performance is compared to conventional cross-correlation HREBSD, and cross-correlation HREBSD with remapping. ICGN-based HREBSD is shown to have about half the strain error of the best cross-correlation method with a comparable computation time.
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