Your browser doesn't support javascript.
loading
Optical properties of thickness-controlled PtSe2 thin films studied via spectroscopic ellipsometry.
He, Junbo; Jiang, Wei; Zhu, Xudan; Zhang, Rongjun; Wang, Jianlu; Zhu, Meiping; Wang, Songyou; Zheng, Yuxiang; Chen, Liangyao.
Affiliation
  • He J; Key Laboratory of Micro and Nano Photonic Structures, Ministry of Education, Shanghai Engineering Research Center of Ultra-Precision Optical Manufacturing, Department of Optical Science and Engineering, Fudan University, Shanghai 200433, China. rjzhang@fudan.edu.cn.
Phys Chem Chem Phys ; 22(45): 26383-26389, 2020 Nov 25.
Article in En | MEDLINE | ID: mdl-33179645
Fulltext
Add to My VHL
Print
XML
PubMed Links
Search on Google

Full text: 1 Database: MEDLINE Type of study: Prognostic_studies Language: En Journal: Phys Chem Chem Phys Journal subject: BIOFISICA / QUIMICA Year: 2020 Type: Article Affiliation country: China
Fulltext
Add to My VHL
Print
XML
PubMed Links
Search on Google

Full text: 1 Database: MEDLINE Type of study: Prognostic_studies Language: En Journal: Phys Chem Chem Phys Journal subject: BIOFISICA / QUIMICA Year: 2020 Type: Article Affiliation country: China