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Effect of self and extrinsic encapsulation on electron resilience of porous 2D polymer nanosheets.
Mücke, David; Linck, Martin; Guzzinati, Giulio; Müller, Heiko; Levin, Barnaby D A; Bammes, Benjamin E; Brouwer, Raúl González; Jelezko, Fedor; Qi, Haoyuan; Kaiser, Ute.
Affiliation
  • Mücke D; Central Facility for Materials Science Electron Microscopy, Albert-Einstein-Allee 11, Universität Ulm, 89081 Ulm, Germany. Electronic address: david.muecke@uni-ulm.de.
  • Linck M; Corrected Electron Optical Systems GmbH, Englerstr. 28, 69126 Heidelberg, Germany.
  • Guzzinati G; Corrected Electron Optical Systems GmbH, Englerstr. 28, 69126 Heidelberg, Germany.
  • Müller H; Corrected Electron Optical Systems GmbH, Englerstr. 28, 69126 Heidelberg, Germany.
  • Levin BDA; Direct Electron LP, 13240 Evening Creek S Dr, Ste 311, San Diego, CA, USA.
  • Bammes BE; Direct Electron LP, 13240 Evening Creek S Dr, Ste 311, San Diego, CA, USA.
  • Brouwer RG; Institute for Quantum Optics (IQO) and Center for Integrated Quantum Science and Technology (IQST), Ulm University, 89081 Ulm, Germany.
  • Jelezko F; Institute for Quantum Optics (IQO) and Center for Integrated Quantum Science and Technology (IQST), Ulm University, 89081 Ulm, Germany.
  • Qi H; Central Facility for Materials Science Electron Microscopy, Albert-Einstein-Allee 11, Universität Ulm, 89081 Ulm, Germany; Faculty of Chemistry and Food Chemistry, Mommsenstr. 4, Technische Universität Dresden, 01062 Dresden, Germany.
  • Kaiser U; Central Facility for Materials Science Electron Microscopy, Albert-Einstein-Allee 11, Universität Ulm, 89081 Ulm, Germany. Electronic address: ute.kaiser@uni-ulm.de.
Micron ; 174: 103525, 2023 Nov.
Article in En | MEDLINE | ID: mdl-37595407
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Full text: 1 Database: MEDLINE Language: En Journal: Micron Journal subject: DIAGNOSTICO POR IMAGEM Year: 2023 Type: Article
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Full text: 1 Database: MEDLINE Language: En Journal: Micron Journal subject: DIAGNOSTICO POR IMAGEM Year: 2023 Type: Article