Terahertz Nanofocusing with Cantilevered Terahertz-Resonant Antenna Tips.

Mastel, Stefan; Lundeberg, Mark B; Alonso-González, Pablo; Gao, Yuanda; Watanabe, Kenji; Taniguchi, Takashi; Hone, James; Koppens, Frank H L; Nikitin, Alexey Y; Hillenbrand, Rainer

Mastel, Stefan; Lundeberg, Mark B; Alonso-González, Pablo; Gao, Yuanda; Watanabe, Kenji; Taniguchi, Takashi; Hone, James; Koppens, Frank H L; Nikitin, Alexey Y; Hillenbrand, Rainer.

Afiliación

Mastel S; CIC nanoGUNE , 20018 Donostia-San Sebastian, Spain.
Lundeberg MB; ICFO-Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology , 08860 Castelldefels, Barcelona, Spain.
Alonso-González P; CIC nanoGUNE , 20018 Donostia-San Sebastian, Spain.
Gao Y; Departamento de Física, Universidad de Oviedo , 3307 Oviedo, Spain.
Watanabe K; Department of Mechanical Engineering, Columbia University , New York City, New York 10027, United States.
Taniguchi T; National Institute for Material Science , 1-1 Namiki, Tsukuba 305-0044, Japan.
Hone J; National Institute for Material Science , 1-1 Namiki, Tsukuba 305-0044, Japan.
Koppens FHL; Department of Mechanical Engineering, Columbia University , New York City, New York 10027, United States.
Nikitin AY; ICFO-Institut de Ciències Fotòniques, The Barcelona Institute of Science and Technology , 08860 Castelldefels, Barcelona, Spain.
Hillenbrand R; ICREA - Institució Catalana de Recerça i Estudis Avancats , 08010 Barcelona, Spain.

Nano Lett ; 17(11): 6526-6533, 2017 11 08.

Article en En | MEDLINE | ID: mdl-29035061

Palabras clave

focused ion beam (FIB) machining; graphene detector; resonant near-field probes; scattering-type scanning near-field optical microscopy (s-SNOM); terahertz antennas; terahertz nanoscopy; terahertz s-SNOM

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Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: Nano Lett Año: 2017 Tipo del documento: Article País de afiliación: España