Analytical Platform To Characterize Dopant Solution Concentrations, Charge Carrier Densities in Films and Interfaces, and Physical Diffusion in Polymers Utilizing Remote Field-Effect Transistors.

Jang, Hyun-June; Wagner, Justine; Li, Hui; Zhang, Qingyang; Mukhopadhyaya, Tushita; Katz, Howard E

Jang, Hyun-June; Wagner, Justine; Li, Hui; Zhang, Qingyang; Mukhopadhyaya, Tushita; Katz, Howard E.

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Jang HJ; Department of Materials Science and Engineering , Johns Hopkins University , 3400 N. Charles Street , Baltimore , Maryland 21218 , United States.
Wagner J; Department of Materials Science and Engineering , Johns Hopkins University , 3400 N. Charles Street , Baltimore , Maryland 21218 , United States.
Li H; Department of Materials Science and Engineering , Johns Hopkins University , 3400 N. Charles Street , Baltimore , Maryland 21218 , United States.
Zhang Q; Department of Materials Science and Engineering , Johns Hopkins University , 3400 N. Charles Street , Baltimore , Maryland 21218 , United States.
Mukhopadhyaya T; Department of Materials Science and Engineering , Johns Hopkins University , 3400 N. Charles Street , Baltimore , Maryland 21218 , United States.
Katz HE; Department of Materials Science and Engineering , Johns Hopkins University , 3400 N. Charles Street , Baltimore , Maryland 21218 , United States.

J Am Chem Soc ; 141(12): 4861-4869, 2019 Mar 27.

Article en En | MEDLINE | ID: mdl-30816046

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Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: J Am Chem Soc Año: 2019 Tipo del documento: Article País de afiliación: Estados Unidos