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Effect of Deep-Level Defects on the Performance of CdZnTe Photon Counting Detectors.
Li, Yingrui; Zha, Gangqiang; Wei, Dengke; Yang, Fan; Dong, Jiangpeng; Xi, Shouzhi; Xu, Lingyan; Jie, Wanqi.
Afiliación
  • Li Y; State Key Laboratory of Solidification Processing, and MIIT Key Laboratory of Radiation Detection Materials and Devices, Northwestern Polytechnical University, Xi'an 710072, China.
  • Zha G; State Key Laboratory of Solidification Processing, and MIIT Key Laboratory of Radiation Detection Materials and Devices, Northwestern Polytechnical University, Xi'an 710072, China.
  • Wei D; State Key Laboratory of Solidification Processing, and MIIT Key Laboratory of Radiation Detection Materials and Devices, Northwestern Polytechnical University, Xi'an 710072, China.
  • Yang F; State Key Laboratory of Solidification Processing, and MIIT Key Laboratory of Radiation Detection Materials and Devices, Northwestern Polytechnical University, Xi'an 710072, China.
  • Dong J; State Key Laboratory of Solidification Processing, and MIIT Key Laboratory of Radiation Detection Materials and Devices, Northwestern Polytechnical University, Xi'an 710072, China.
  • Xi S; State Key Laboratory of Solidification Processing, and MIIT Key Laboratory of Radiation Detection Materials and Devices, Northwestern Polytechnical University, Xi'an 710072, China.
  • Xu L; Ametek Co., Ltd., Shaanxi Xixian New Area Qinhan New City Tian Gong 1 road 8-1, Xi'an 712000, China.
  • Jie W; State Key Laboratory of Solidification Processing, and MIIT Key Laboratory of Radiation Detection Materials and Devices, Northwestern Polytechnical University, Xi'an 710072, China.
Sensors (Basel) ; 20(7)2020 Apr 04.
Article en En | MEDLINE | ID: mdl-32260424
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Texto completo: 1 Bases de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Sensors (Basel) Año: 2020 Tipo del documento: Article País de afiliación: China
Texto completo
Añadir a Mi BVS
Imprimir
XML
PubMed Links
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Texto completo: 1 Bases de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Sensors (Basel) Año: 2020 Tipo del documento: Article País de afiliación: China