Your browser doesn't support javascript.
loading
An Intelligence Method for Recognizing Multiple Defects in Rail.
Deng, Fei; Li, Shu-Qing; Zhang, Xi-Ran; Zhao, Lin; Huang, Ji-Bing; Zhou, Cheng.
Afiliación
  • Deng F; School of Electrical and Electronic Engineering, Shang Hai Institute of Technology, Shanghai 201418, China.
  • Li SQ; School of Electrical and Electronic Engineering, Shang Hai Institute of Technology, Shanghai 201418, China.
  • Zhang XR; School of Electrical and Electronic Engineering, Shang Hai Institute of Technology, Shanghai 201418, China.
  • Zhao L; School of Electrical and Electronic Engineering, Shang Hai Institute of Technology, Shanghai 201418, China.
  • Huang JB; School of Electrical and Electronic Engineering, Shang Hai Institute of Technology, Shanghai 201418, China.
  • Zhou C; School of Electrical and Electronic Engineering, Shang Hai Institute of Technology, Shanghai 201418, China.
Sensors (Basel) ; 21(23)2021 Dec 03.
Article en En | MEDLINE | ID: mdl-34884112
Asunto(s)
Palabras clave
Texto completo
Añadir a Mi BVS
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Bases de datos: MEDLINE Asunto principal: Algoritmos / Máquina de Vectores de Soporte Tipo de estudio: Prognostic_studies Idioma: En Revista: Sensors (Basel) Año: 2021 Tipo del documento: Article País de afiliación: China
Texto completo
Añadir a Mi BVS
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Bases de datos: MEDLINE Asunto principal: Algoritmos / Máquina de Vectores de Soporte Tipo de estudio: Prognostic_studies Idioma: En Revista: Sensors (Basel) Año: 2021 Tipo del documento: Article País de afiliación: China