Signal Enhanced FTIR Analysis of Alignment in NAFION Thin Films at SiO<sub>2</sub> and Au Interfaces.

Zimudzi, Tawanda J; Hickner, Michael A

Signal Enhanced FTIR Analysis of Alignment in NAFION Thin Films at SiO₂ and Au Interfaces.

Zimudzi, Tawanda J; Hickner, Michael A.

Afiliación

Zimudzi TJ; Department of Material Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, United States.
Hickner MA; Department of Material Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802, United States.

ACS Macro Lett ; 5(1): 83-87, 2016 Jan 19.

Article en En | MEDLINE | ID: mdl-35668583

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Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: ACS Macro Lett Año: 2016 Tipo del documento: Article País de afiliación: Estados Unidos