Plasmonic-Enhanced Bright Single Spin Defects in Silicon Carbide Membranes.

Zhou, Ji-Yang; Li, Qiang; Hao, Zhi-He; Lin, Wu-Xi; He, Zhen-Xuan; Liang, Rui-Jian; Guo, Liping; Li, Hao; You, Lixing; Tang, Jian-Shun; Xu, Jin-Shi; Li, Chuan-Feng; Guo, Guang-Can

Zhou, Ji-Yang; Li, Qiang; Hao, Zhi-He; Lin, Wu-Xi; He, Zhen-Xuan; Liang, Rui-Jian; Guo, Liping; Li, Hao; You, Lixing; Tang, Jian-Shun; Xu, Jin-Shi; Li, Chuan-Feng; Guo, Guang-Can.

Afiliación

Zhou JY; CAS Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China.
Li Q; CAS Center for Excellence in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China.
Hao ZH; CAS Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China.
Lin WX; CAS Center for Excellence in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China.
He ZX; CAS Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China.
Liang RJ; CAS Center for Excellence in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China.
Guo L; CAS Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China.
Li H; CAS Center for Excellence in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China.
You L; Hefei National Laboratory, University of Science and Technology of China, Hefei 230088, China.
Tang JS; CAS Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China.
Xu JS; CAS Center for Excellence in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei 230026, China.
Li CF; CAS Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, China.
Guo GC; Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education and School of Physics and Technology, Wuhan University, Wuhan 430072, China.

Nano Lett ; 23(10): 4334-4343, 2023 May 24.

Article en En | MEDLINE | ID: mdl-37155148

Palabras clave

fluorescence enhancement; lifetime; silicon carbide; single defects; surface plasmon

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Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: Nano Lett Año: 2023 Tipo del documento: Article País de afiliación: China