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Low voltage-driven high-performance thermal switching in antiferroelectric PbZrO3 thin films.
Liu, Chenhan; Si, Yangyang; Zhang, Hua; Wu, Chao; Deng, Shiqing; Dong, Yongqi; Li, Yijie; Zhuo, Meng; Fan, Ningbo; Xu, Bin; Lu, Ping; Zhang, Lifa; Lin, Xi; Liu, Xingjun; Yang, Juekuan; Luo, Zhenlin; Das, Sujit; Bellaiche, Laurent; Chen, Yunfei; Chen, Zuhuang.
Afiliación
  • Liu C; Micro- and Nano-scale Thermal Measurement and Thermal Management Laboratory, Jiangsu Key Laboratory for Numerical Simulation of Large-Scale Complex Systems, School of Energy and Mechanical Engineering, Nanjing Normal University, Nanjing 210023, P. R. China.
  • Si Y; School of Materials Science and Engineering, Harbin Institute of Technology, Shenzhen, Guangdong 518055, P. R. China.
  • Zhang H; Jiangsu Key Laboratory for Design and Manufacture of Micro-Nano Biomedical Instruments, School of Mechanical Engineering, Southeast University, Nanjing 211100, P. R. China.
  • Wu C; Jiangsu Key Laboratory for Design and Manufacture of Micro-Nano Biomedical Instruments, School of Mechanical Engineering, Southeast University, Nanjing 211100, P. R. China.
  • Deng S; Beijing Advanced Innovation Center for Materials Genome Engineering, University of Science and Technology Beijing, Beijing 100083, P. R. China.
  • Dong Y; National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230026, P. R. China.
  • Li Y; School of Materials Science and Engineering, Harbin Institute of Technology, Shenzhen, Guangdong 518055, P. R. China.
  • Zhuo M; Micro- and Nano-scale Thermal Measurement and Thermal Management Laboratory, Jiangsu Key Laboratory for Numerical Simulation of Large-Scale Complex Systems, School of Energy and Mechanical Engineering, Nanjing Normal University, Nanjing 210023, P. R. China.
  • Fan N; Institute of Theoretical and Applied Physics, Jiangsu Key Laboratory of Thin Films, School of Physical Science and Technology, Soochow University, Suzhou, Jiangsu 215006, P. R. China.
  • Xu B; Institute of Theoretical and Applied Physics, Jiangsu Key Laboratory of Thin Films, School of Physical Science and Technology, Soochow University, Suzhou, Jiangsu 215006, P. R. China.
  • Lu P; Micro- and Nano-scale Thermal Measurement and Thermal Management Laboratory, Jiangsu Key Laboratory for Numerical Simulation of Large-Scale Complex Systems, School of Energy and Mechanical Engineering, Nanjing Normal University, Nanjing 210023, P. R. China.
  • Zhang L; Phonon Engineering Research Center, School of Physics and Technology, Nanjing Normal University, Nanjing 210023, P. R. China.
  • Lin X; School of Materials Science and Engineering, Harbin Institute of Technology, Shenzhen, Guangdong 518055, P. R. China.
  • Liu X; School of Materials Science and Engineering, Harbin Institute of Technology, Shenzhen, Guangdong 518055, P. R. China.
  • Yang J; Jiangsu Key Laboratory for Design and Manufacture of Micro-Nano Biomedical Instruments, School of Mechanical Engineering, Southeast University, Nanjing 211100, P. R. China.
  • Luo Z; National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230026, P. R. China.
  • Das S; Material Research Centre, Indian Institute of Science, Bangalore 560012, India.
  • Bellaiche L; Physics Department and Institute for Nanoscience and Engineering, University of Arkansas, Fayetteville, AR 72701, USA.
  • Chen Y; Jiangsu Key Laboratory for Design and Manufacture of Micro-Nano Biomedical Instruments, School of Mechanical Engineering, Southeast University, Nanjing 211100, P. R. China.
  • Chen Z; School of Materials Science and Engineering, Harbin Institute of Technology, Shenzhen, Guangdong 518055, P. R. China.
Science ; 382(6676): 1265-1269, 2023 Dec 15.
Article en En | MEDLINE | ID: mdl-38096375

Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: Science Año: 2023 Tipo del documento: Article

Texto completo: 1 Bases de datos: MEDLINE Idioma: En Revista: Science Año: 2023 Tipo del documento: Article