The DEPFET Sensor-Amplifier Structure: A Method to Beat 1/f Noise and Reach Sub-Electron Noise in Pixel Detectors.

Lutz, Gerhard; Porro, Matteo; Aschauer, Stefan; Wölfel, Stefan; Strüder, Lothar

Lutz, Gerhard; Porro, Matteo; Aschauer, Stefan; Wölfel, Stefan; Strüder, Lothar.

Afiliação

Lutz G; PNSENSOR GmbH, München D-81739, Germany. gerhard.lutz@pnsensor.de.
Porro M; European X-ray Free-Electron Laser Facility GmbH, Hamburg D-22761, Germany. matteo.porro@xfel.eu.
Aschauer S; PNSENSOR GmbH, München D-81739, Germany. stefan.aschauer@pnsensor.de.
Wölfel S; Gründeläckerstr. 28, Dormitz D-91077, Germany. stefan.woelfel@steppke.de.
Strüder L; PNSENSOR GmbH, München D-81739, Germany. lothar.strueder@pnsensor.com.

Sensors (Basel) ; 16(5)2016 04 28.

Article em En | MEDLINE | ID: mdl-27136549

Palavras-chave

DEPFET; X-ray spectroscopy; charge measurement; photon detection; pixel detector; sub-electron precision

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Texto completo: 1 Bases de dados: MEDLINE Idioma: En Revista: Sensors (Basel) Ano de publicação: 2016 Tipo de documento: Article País de afiliação: Alemanha