Cross-Plane Seebeck Coefficient Measurement of Misfit Layered Compounds (SnSe)n(TiSe2)n (n = 1,3,4,5).

Li, Zhen; Bauers, Sage R; Poudel, Nirakar; Hamann, Danielle; Wang, Xiaoming; Choi, David S; Esfarjani, Keivan; Shi, Li; Johnson, David C; Cronin, Stephen B

Cross-Plane Seebeck Coefficient Measurement of Misfit Layered Compounds (SnSe)_n(TiSe₂)_n (n = 1,3,4,5).

Li, Zhen; Bauers, Sage R; Poudel, Nirakar; Hamann, Danielle; Wang, Xiaoming; Choi, David S; Esfarjani, Keivan; Shi, Li; Johnson, David C; Cronin, Stephen B.

Afiliação

Bauers SR; Department of Chemistry, University of Oregon , Eugene, Oregon 97403-1253, United States.
Hamann D; Department of Chemistry, University of Oregon , Eugene, Oregon 97403-1253, United States.
Wang X; Department of Physics and Astronomy University of Toledo , Toledo, Ohio 43606-3390, United States.
Choi DS; Institute for Advanced Materials, Devices and Nanotechnology, Rutgers University , Piscataway, New Jersey 08854, United States.
Esfarjani K; Department of Mechanical Engineering, The University of Texas at Austin , Austin, Texas 78712-0292, United States.
Shi L; Department of Mechanical and Aerospace Engineering, University of Virginia , Charlottesville, Virginia 22904-4746, United States.
Johnson DC; Department of Mechanical Engineering, The University of Texas at Austin , Austin, Texas 78712-0292, United States.
Cronin SB; Department of Chemistry, University of Oregon , Eugene, Oregon 97403-1253, United States.

Nano Lett ; 17(3): 1978-1986, 2017 03 08.

Article em En | MEDLINE | ID: mdl-28177640