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Resistive switching mechanism of GeTe-Sb2Te3 interfacial phase change memory and topological properties of embedded two-dimensional states.
Nakamura, Hisao; Rungger, Ivan; Sanvito, Stefano; Inoue, Nobuki; Tominaga, Junji; Asai, Yoshihiro.
Afiliação
  • Nakamura H; CD-FMat, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba Central 2, Tsukuba, Ibaraki 305-8568, Japan. hs-nakamura@aist.go.jp.
Nanoscale ; 9(27): 9386-9395, 2017 Jul 13.
Article em En | MEDLINE | ID: mdl-28657077
ABSTRACT
A theoretical study of an interfacial phase change memory made of a GeTe-Sb2Te3 superlattice with W electrodes is presented to identify the high and low resistance states and the switching mechanism. The ferro structure of the GeTe layer block in the Te-Ge-Te-Ge sequence can be in the low resistance state only if the SET/RESET mode consists of a two step dynamical process, corresponding to a vertical flip of the Ge layer with respect to the Te layer, followed by lateral motion driven by thermal relaxation. The importance of spin-orbit coupling at the GeTe/Sb2Te3 interface to the "bias polarity-dependent" SET/RESET operation is shown, and an analysis of the two-dimensional states confined at the GeTe/Sb2Te3 interface inside the resistive switching layer is presented. Our results allow us to propose a phase diagram for the transition from a topologically nontrivial to a trivial gap state of these two-dimensional compounds.

Texto completo: 1 Bases de dados: MEDLINE Idioma: En Revista: Nanoscale Ano de publicação: 2017 Tipo de documento: Article País de afiliação: Japão

Texto completo: 1 Bases de dados: MEDLINE Idioma: En Revista: Nanoscale Ano de publicação: 2017 Tipo de documento: Article País de afiliação: Japão