Application of Two-Photon-Absorption Pulsed Laser for Single-Event-Effects Sensitivity Mapping Technology.

Gu, Cheng; Chen, Rui; Belev, George; Shi, Shuting; Tian, Haonan; Nofal, Issam; Chen, Li

Gu, Cheng; Chen, Rui; Belev, George; Shi, Shuting; Tian, Haonan; Nofal, Issam; Chen, Li.

Afiliação

Gu C; Electrical Computer Engineering, University of Saskatchewan, Engineering Building 57 Campus Dr, Saskatoon, SK S7N5A9, Canada. gucheng.alex@usask.ca.
Chen R; Electrical Computer Engineering, University of Saskatchewan, Engineering Building 57 Campus Dr, Saskatoon, SK S7N5A9, Canada. chg576@mail.usask.ca.
Belev G; Saskatchewan Structural Science Centre, University of Saskatchewan, Thorvaldson Building Office 192, 110 Science Place, Saskatoon, SK S7N5E2, Canada. gsb808@mail.usask.ca.
Shi S; Electrical Computer Engineering, University of Saskatchewan, Engineering Building 57 Campus Dr, Saskatoon, SK S7N5A9, Canada. sst1124@163.com.
Tian H; Electrical Computer Engineering, University of Saskatchewan, Engineering Building 57 Campus Dr, Saskatoon, SK S7N5A9, Canada. hat541@mail.usask.ca.
Nofal I; iROC Technologies, 38000 Grenoble, France. issam.nofal@iroctech.com.
Chen L; Electrical Computer Engineering, University of Saskatchewan, Engineering Building 57 Campus Dr, Saskatoon, SK S7N5A9, Canada. lic900@mail.usask.ca.

Materials (Basel) ; 12(20)2019 Oct 18.

Article em En | MEDLINE | ID: mdl-31635272

Palavras-chave

SRAM; pulsed laser; sensitive mapping; single event effect; two photon absorption

Texto completo

Adicionar na Minha BVS

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Bases de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Revista: Materials (Basel) Ano de publicação: 2019 Tipo de documento: Article País de afiliação: Canadá

Texto completo

Adicionar na Minha BVS

Imprimir

XML

PubMed Links

Buscar no Google