Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure.
Sensors (Basel)
; 20(7)2020 Apr 04.
Article
em En
| MEDLINE
| ID: mdl-32260443
ABSTRACT
An ultrahigh resolution thickness measurement sensor was proposed based on a single mode-hollow core-single mode (SMF-HCF-SMF) fiber structure by coating a thin layer of material on the HCF surface. Theoretical analysis shows that the SMF-HCF-SMF fiber structure can measure coating thickness down to sub-nanometers. An experimental study was carried out by coating a thin layer of graphene oxide (GO) on the HCF surface of the fabricated SMF-HCF-SMF fiber structure. The experimental results show that the fiber sensor structure can detect a thin layer with a thickness down to 0.21 nanometers, which agrees well with the simulation results. The proposed sensing technology has the advantages of simple configuration, ease of fabrication, low cost, high resolution, and good repeatability, which offer great potential for practical thickness measurement applications.
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Bases de dados:
MEDLINE
Idioma:
En
Revista:
Sensors (Basel)
Ano de publicação:
2020
Tipo de documento:
Article
País de afiliação:
China