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Optical Interferometric Fringe Pattern-Incorporated Spectrum Calibration Technique for Enhanced Sensitivity of Spectral Domain Optical Coherence Tomography.
Han, Sangyeob; Wijesinghe, Ruchire Eranga; Jeon, Deokmin; Han, Youngmin; Lee, Jaeyul; Lee, Junsoo; Jo, Hosung; Lee, Dong-Eun; Jeon, Mansik; Kim, Jeehyun.
Afiliação
  • Han S; School of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80, Daehak-ro, Buk-gu, Daegu 41566, Korea.
  • Wijesinghe RE; Department of Biomedical Engineering, College of Engineering, Kyungil University, 50, Gamasil-gil, Hayang-eup, Gyeongsan-si, Gyeongsangbuk-do 38428, Korea.
  • Jeon D; Department of Autonomous Robot Engineering, College of Smart Engineering, Kyungil University, 50, Gamasil-gil, Hayang-eup, Gyeongsan-si, Gyeongsangbuk-do 38428, Korea.
  • Han Y; School of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80, Daehak-ro, Buk-gu, Daegu 41566, Korea.
  • Lee J; Department of Nuclear Energy Convergence, Kyungil University, 50, Gamasil-gil, Hayang-eup, Gyeongsan-si, Gyeongsangbuk-do 38428, Korea.
  • Lee J; School of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80, Daehak-ro, Buk-gu, Daegu 41566, Korea.
  • Jo H; School of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80, Daehak-ro, Buk-gu, Daegu 41566, Korea.
  • Lee DE; School of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80, Daehak-ro, Buk-gu, Daegu 41566, Korea.
  • Jeon M; School of Architecture and Civil Engineering, Kyungpook National University, 80, Daehak-ro, Buk-gu, Daegu 41566, Korea.
  • Kim J; School of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80, Daehak-ro, Buk-gu, Daegu 41566, Korea.
Sensors (Basel) ; 20(7)2020 Apr 07.
Article em En | MEDLINE | ID: mdl-32272646
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Texto completo: 1 Bases de dados: MEDLINE Tipo de estudo: Diagnostic_studies / Prognostic_studies Idioma: En Revista: Sensors (Basel) Ano de publicação: 2020 Tipo de documento: Article
Texto completo
Adicionar na Minha BVS
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Bases de dados: MEDLINE Tipo de estudo: Diagnostic_studies / Prognostic_studies Idioma: En Revista: Sensors (Basel) Ano de publicação: 2020 Tipo de documento: Article